Stabilization of beta-Bi2O3, by hafnia

被引：12

作者：

Ayala, A ^{[1
]}

LopezGarcia, A ^{[1
]}

Leyva, AG ^{[1
]}

deBenyacar, MAR ^{[1
]}

机构：

[1] COMIS NACL ENERGIA ATOM,DIV FIS SOLIDO,BUENOS AIRES,DF,ARGENTINA

来源：

SOLID STATE COMMUNICATIONS | 1996年 / 99卷 / 06期

关键词：

Crystal defects - Hafnium compounds - Microscopic examination - Oxides - Stabilization - X ray diffraction analysis;

D O I：

10.1016/0038-1098(96)00237-2

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

The addition of HfO2 into Bi2O3 causes stabilization at RT of the beta-phase. This material is characterized by XRD, TEM, EDAX and time-differential perturbed-angular-correlation spectroscopy (PAC). The beta and delta phases were detected and characterized. The oxygen vacancy occupation is compared with beta-Bi2O3 stabilized by other oxides. Copyright (C) 1996 Elsevier Science Ltd

引用

页码：451 / 455

页数：5

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