Shape measurement using additive-subtractive phase shifting speckle interferometry

被引:10
作者
Wang, LS
Krishnaswamy, S
机构
[1] Ctr. Qual. Eng. and Failure Prev., Robert R McCormick Sch. Eng. A., Northwestern University, Evanston
关键词
D O I
10.1088/0957-0233/7/12/009
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This paper describes an optical technique for shape measurement that works satisfactorily in relatively severe noisy conditions by using additive-subtractive phase-modulated electronic speckle pattern interferometry (AS-ESPI). Through repetitively altering the illumination angle of one interfering beam at a frequency much higher than the video frame rate, and by simultaneously locking the beam tilting via laser strobing, random noises that normally are of much lower frequency than that of the repetitive tilting can be removed by frame averaging of the AS-ESPI correlation fringe patterns. A procedure of phase shifting that is synchronized with the repetitive tilting is utilized to perform data reduction. Quantitative experimental results obtained under rather noisy conditions are presented to show the validity of the principle.
引用
收藏
页码:1748 / 1754
页数:7
相关论文
共 18 条
[1]  
BOYER KL, 1987, IEEE T PATTERN ANAL, V9, P4
[2]  
Creath K., 1988, Progress in optics. Vol.XXVI, P349, DOI 10.1016/S0079-6638(08)70178-1
[3]  
DOVAL AF, 1994, P SOC PHOTO-OPT INS, V2358, P187
[4]   CELLULAR-AUTOMATA METHOD FOR PHASE UNWRAPPING [J].
GHIGLIA, DC ;
MASTIN, GA ;
ROMERO, LA .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1987, 4 (01) :267-280
[5]  
Jones R., 1989, HOLOGRAPHIC SPECKLE, DOI DOI 10.1017/CBO9780511622465
[6]  
MONTGOMERY PC, 1987, THESIS LOUGHBOROUGH
[7]   FRINGE SCANNING SPECKLE-PATTERN INTERFEROMETRY [J].
NAKADATE, S ;
SAITO, H .
APPLIED OPTICS, 1985, 24 (14) :2172-2180
[8]   ADDITIVE-SUBTRACTIVE PHASE-MODULATED ELECTRONIC SPECKLE INTERFEROMETRY - ANALYSIS OF FRINGE VISIBILITY [J].
POUET, BF ;
KRISHNASWAMY, S .
APPLIED OPTICS, 1994, 33 (28) :6609-6616
[9]  
PRYPUTNIEWICZ RJ, 1989, P SOC PHOTO-OPT INS, V1162, P456
[10]   AUTOMATED PHASE-MEASURING PROFILOMETRY OF 3-D DIFFUSE OBJECTS [J].
SRINIVASAN, V ;
LIU, HC ;
HALIOUA, M .
APPLIED OPTICS, 1984, 23 (18) :3105-3108