New soft X-ray facility SINS for surface and nanoscale science at SSLS

被引:109
作者
Yu, XJ
Wilhelmi, O
Moser, HO
Vidyaraj, SV
Gao, XY
Wee, ATS
Nyunt, T
Qian, HJ
Zheng, HW
机构
[1] Natl Univ Singapore, SSLS, Singapore 117603, Singapore
[2] Natl Univ Singapore, Dept Phys, Singapore 117542, Singapore
[3] Acad Sinica, Inst High Energy Phys, Beijing 100039, Peoples R China
关键词
SINS; beamline; monochromator; XMCD; photoemission;
D O I
10.1016/j.elspec.2005.01.256
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
The first soft X-ray facility at the Singapore Synchrotron Light Source was built by FMB and commissioned in 2003. Dubbed SINS for surface, interface, and nanostructure science, it covers a photon energy range from 50 to 1200 eV. The photon beam can be set to left circular, right circular or linear polarization by changing the pitch and vertical position of the vertical focusing mirror of the prefocusing optics. The typical resolution (E/Delta E) and flux are about 1000 at 10(10) photons/s or exceeding 4000 at 10(8) photons/s in a spot of about 1.5 mm x 0.2 nun on the sample. The performance of the beamline was measured using gas photoionization spectra of Ar, He, Kr, and N-2 as well as an XMCD spectrum of a Ni sample. From the Ni XMCD signal, calculation shows that the degree of circular polarization can reach 95% at 850 eV photon energy. The end-station is presently equipped with a hemispherical electron energy analyzer and typical surface science diagnostics including LEED and ion sputtering. Upgrading with an in situ STM/AFM and a growth chamber is underway which will make SINS a unique tool for in situ surface and nanoscale science studies. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:1031 / 1034
页数:4
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