Complex permittivity determination from propagation constant measurements

被引：224

作者：

Janezic, MD ^{[1
]}

Jargon, JA ^{[1
]}

机构：

[1] Natl Inst Stand & Technol, Boulder, CO 80303 USA

来源：

IEEE MICROWAVE AND GUIDED WAVE LETTERS | 1999年 / 9卷 / 02期

关键词：

dielectric constant; measurement; permittivity; propagation constant;

D O I：

10.1109/75.755052

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This letter presents a new transmission line method for measuring the complex permittivity of dielectric materials using propagation constant measurements. In contrast to previous methods. a network analyzer calibration is unnecessary since calibrated scattering parameters are not required, We use measurements in S-band waveguide to show that this technique compares well with the transmission/reflection and cylindrical cavity methods.

引用

页码：76 / 78

页数：3

共 6 条

[1]

Baker-Jarvis J., 1993, 1355R NAT I STAND TE

[2] IMPROVED TECHNIQUE FOR DETERMINING COMPLEX PERMITTIVITY WITH THE TRANSMISSION REFLECTION METHOD [J].