XPS and bonding: when and why can relaxation effects be ignored

被引：16

作者：

Barr, TL ^{[1
]}

Hoppe, E

Dugall, T

Shah, P

Seal, S

机构：

[1] Univ Wisconsin, Dept Mat & Lab Surface Studies, Milwaukee, WI 53706 USA

[2] Univ Florida, Adv Mat Proc Anal Ctr, Gainesville, FL USA

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 1999年 / 98卷

关键词：

bonding; chemical shift; XPS;

D O I：

10.1016/S0368-2048(98)00278-3

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

The arguments behind the use of the term 'chemical Shift' in X-ray photoelectron (ESCA) spectroscopy are explored. The factors that relate to initial state (chemical) vs final state (relaxation) contributions are described along with relationships to applied cases, with a particular emphasis on oxides. It is demonstrated that some major classes of oxides, such as silicates, are excellent examples of systems for which the measured binding energy shifts are directly related to differences in initial state chemistry. (C) 1999 Elsevier Science B.V. All rights reserved.

引用

页码：95 / 103

页数：9

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