Glass and silicon probes: A comparative theoretical study for near-field optical microscopy

被引:15
作者
Castiaux, A
Danzebrink, HU
Bouju, X
机构
[1] Fac Univ Notre Dame Paix, Lab Phys Solide, B-5000 Namur, Belgium
[2] Univ Franche Comte, Phys Mol Lab, UMR CNRS 6624, F-25030 Besancon, France
关键词
D O I
10.1063/1.368095
中图分类号
O59 [应用物理学];
学科分类号
摘要
Glass fibers, chemically etched at their extremities and covered with a thin metal coating, are often present in near-field optical microscopy. Such elongated systems can be used to either probe the evanescent components of the electromagnetic field at the surface of a sample, or locally couple this sample with optical evanescent waves. In this article, we analyze theoretically an alternative tip design made with a silicon core. This kind of probe could be very useful when infrared properties of a surface are to be investigated. The advantages of using such a material for near-field optical detection will be stressed and compared with the performances of a bulk glass fiber. (C) 1998 American Institute of Physics.
引用
收藏
页码:52 / 57
页数:6
相关论文
共 20 条
[1]   A PERTURBATIVE DIFFRACTION THEORY OF A MULTILAYER SYSTEM - APPLICATIONS TO NEAR-FIELD OPTICAL MICROSCOPY SNOM AND STOM [J].
BARCHIESI, D ;
VANLABEKE, D .
ULTRAMICROSCOPY, 1995, 57 (2-3) :196-203
[2]   2-DIMENSIONAL NUMERICAL-SIMULATION OF THE PHOTON SCANNING TUNNELING MICROSCOPE - CONCEPT OF TRANSFER-FUNCTION [J].
CARMINATI, R ;
GREFFET, JJ .
OPTICS COMMUNICATIONS, 1995, 116 (4-6) :316-321
[3]   Electrodynamics in complex systems: Application to near-field probing of optical microresonators [J].
Castiaux, A ;
Girard, C ;
Dereux, A ;
Martin, OJF ;
Vigneron, JP .
PHYSICAL REVIEW E, 1996, 54 (05) :5752-5760
[4]   Transmission scanning near-field optical microscopy with uncoated silicon tips [J].
Danzebrink, HU ;
Castiaux, A ;
Girard, C ;
Bouju, X ;
Wilkening, G .
ULTRAMICROSCOPY, 1998, 71 (1-4) :371-377
[5]   Investigation of the electric-field distribution at the subwavelength aperture of a near-field scanning optical microscope [J].
Decca, RS ;
Drew, HD ;
Empson, KL .
APPLIED PHYSICS LETTERS, 1997, 70 (15) :1932-1934
[6]   NEAR-FIELD OPTICAL-SCANNING MICROSCOPY [J].
DURIG, U ;
POHL, DW ;
ROHNER, F .
JOURNAL OF APPLIED PHYSICS, 1986, 59 (10) :3318-3327
[7]  
GIRARD C, COMMUNICATION
[8]   Beam divergence and waist measurements of laser diodes by near-field scanning optical microscopy [J].
Herzog, WD ;
Unlu, MS ;
Goldberg, BB ;
Rhodes, GH ;
Harder, C .
APPLIED PHYSICS LETTERS, 1997, 70 (06) :688-690
[9]   Material contrast in scanning near-field optical microscopy at 1-10 nm resolution [J].
Koglin, J ;
Fischer, UC ;
Fuchs, H .
PHYSICAL REVIEW B, 1997, 55 (12) :7977-7984
[10]  
Kong J.A., 1975, Theory of Electromagnetic Waves