Near-field imaging by negative permittivity media

被引:11
作者
Lu, WT [1 ]
Sridhar, S [1 ]
机构
[1] Northeastern Univ, Dept Phys, Boston, MA 02115 USA
关键词
near-field imaging; evanescent waves; negative permittivity; refraction; transmission; REFRACTION;
D O I
10.1002/mop.11191
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The imaging of the nearfield by a slab of negative permittivity medium is discussed. The performance of this flat lens is limited by the working wavenumber k(0) and the slab thickness d For k(0)d much less than 0.937, the resolution of the flat lens can be smaller than the wavelength and depends logarithmically on 1/k(0)d. The electric field is finite everywhere, but will diverge algebraically as one reduces k(0)d --> 0. (C) 2003 Wiley Periodicals, Inc.
引用
收藏
页码:282 / 286
页数:5
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