Surface reactivity of nanostructured tin oxide and Pt-doped tin oxide as studied by EPR and XPS spectroscopies

被引：53

作者：

Morazzoni, F

Canevali, C

Chiodini, N

Mari, C

Ruffo, R

Scotti, R

Armelao, L

Tondello, E

Depero, L

Bontempi, E

机构：

[1] Univ Milano Bicocca, Dept Mat Sci, I-20125 Milan, Italy

[2] CNR, CSSRCC, I-35100 Padua, Italy

[3] Univ Brescia, Dipartimento Ingn Meccan, Lab Struttursit Chim, I-25123 Brescia, Italy

来源：

MATERIALS SCIENCE & ENGINEERING C-BIOMIMETIC AND SUPRAMOLECULAR SYSTEMS | 2001年 / 15卷 / 1-2期

关键词：

Pt-doped SnO2; nanostructured thin films; EPR; XPS;

D O I：

10.1016/S0928-4931(01)00255-7

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Nanostructured (3-6 nm) thin films (80 nm) of SnO2 and Pt-doped SnO2 were obtained by a new sol-gel route using tetra(tert-butoxy)tin(IV) and bis(acetylacetonato)platinum(II) as precursors. EPR and XPS investigations, performed on thin films after interaction with CO, demonstrated that singly ionized oxygen vacancies (V-o(.)) fully transferred their electrons to the noble metal and reduced Pt(IV) to Pt(ll). Contact with air at room temperature led to the reduction of O-2 to O-2(-), therefore, re-oxidizing metal centers. The reaction mechanism concords with the high electrical sensitivity of this material. (C) 2001 Elsevier Science B.V. All rights reserved.

引用

页码：167 / 169

页数：3