Density functional theory study of adsorption and dissociation of HfCl4 and H2O on Ge/Si(100)-(2x1):: Initial stage of atomic layer deposition of HfO2 on SiGe surface -: art. no. 142901

被引:10
作者
Chen, W [1 ]
Lu, HL [1 ]
Zhang, DW [1 ]
Xu, M [1 ]
Ren, J [1 ]
Zhang, JY [1 ]
Wang, JT [1 ]
Wang, LK [1 ]
机构
[1] Fudan Univ, Dept Microelect, State Key Lab ASIC & Syst, Shanghai 200433, Peoples R China
关键词
D O I
10.1063/1.1899253
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have investigated adsorption and dissociation of water and HfCl4 on Ge/Si(100)-(2x1) surface with density functional theory. The Si-Ge heterodimer and Ge-Ge homodimer are employed to represent the Si1-xGex surface. The activation energy for adsorption of water on Ge-Ge homodimer is much higher than that on Si-Ge heterodimer. No net activation barrier exists during the adsorption of HfCl4 on both SiGe surface dimers. The differences in the potential energy surface between reactions on Si-Ge and Ge-Ge dimers are due to different bond strengths. It should also be noticed that the activation energy for HfCl4 is quite flat, thus HfCl4 adsorbs and dissociates on Ge/Si(100)-(2x1) easily. (C) 2005 American Institute of Physics.
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页码:1 / 3
页数:3
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