Ferroelectric embedded devices

被引:7
作者
Takasu, H [1 ]
Nakamura, T [1 ]
Kamisawa, A [1 ]
机构
[1] Rohm Co Ltd, ULSI Res & Dev Headquarters, Ukyo Ku, Kyoto 6158585, Japan
关键词
Pb(Ti; Zr)O-3 thin films; embedded memory; Ir based electrode; STC cell; multi level metallization;
D O I
10.1080/10584589808202049
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Ferroelectric memory is expected not only for a standard memory but also for embedded memories in logic LSIs such as smart cards and microcomputers, because it's electrical characteristics and process compatibility are adequate for embedded. For embedded devices, a high speed operation and a reduction in memory cell area are required. In order to apply the ferroelectric memory to the embedded devices widely, a multi level metallization (for high speed operation), a stacked capacitor cell (for reduction the cell area) and other techniques are necessary. In this paper, our approach for the ferroelectric embedded device will be presented.
引用
收藏
页码:41 / 51
页数:11
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