Using colloidal gold nanoparticals for studies of laser interaction with defects in thin films

被引:19
作者
Papernov, S [1 ]
Schmid, AW [1 ]
Krishnan, R [1 ]
Tsybeskov, L [1 ]
机构
[1] Univ Rochester, Laser Energet Lab, Rochester, NY 14623 USA
来源
LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 2000, PROCEEDINGS | 2001年 / 4347卷
关键词
laser-induced damage; thin films; gold nanoparticles; atomic force microscopy;
D O I
10.1117/12.425037
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A model thin-film system based on SiO2 coating with artificially introduced gold nanoparticles was investigated for the mechanism of 351-nm, pulsed-laser-radiation interaction with well-characterized nanoabsorbers. Damage morphology, represented by craters, provides strong evidence of the important role of the melting and vaporization processes. Measured crater volumes and numerical estimates based on them suggest that crater formation can not proceed through laser-energy absorption confined within the particle. It instead starts in the particle and then, due to energy transfer, spreads out to the surrounding matrix during the laser pulse.
引用
收藏
页码:146 / 154
页数:9
相关论文
共 7 条
[1]  
[Anonymous], 2011, RECENT PAT BIOTECHNO
[2]  
[Anonymous], HDB GLASS MANUFACTUR
[3]  
Danileiko Yu. K., 1978, Soviet Journal of Quantum Electronics, V8, P116, DOI 10.1070/QE1978v008n01ABEH008443
[4]   Thin films laser damage mechanisms at the YAG third harmonic [J].
Dijon, J ;
Hue, J ;
Disgecmez, A ;
Quesnel, E ;
Rolland, B .
LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 1995: 27TH ANNUAL BOULDER DAMAGE SYMPOSIUM, PROCEEDINGS, 1996, 2714 :416-425
[5]  
DIJON J, 1996, LASER INDUCED DAMAGE, V2966, P315
[6]   One step closer to the intrinsic laser-damage threshold of HfO2 and SiO2 monolayer thin films [J].
Papernov, S ;
Zaksas, D ;
Anzellotti, JF ;
Smith, DJ ;
Schmid, AW ;
Collier, DR ;
Carbone, FA .
LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 1997, PROCEEDINGS, 1998, 3244 :434-445
[7]   Localized absorption effects during 351 nm, pulsed laser irradiation of dielectric multilayer thin films [J].
Papernov, S ;
Schmid, AW .
JOURNAL OF APPLIED PHYSICS, 1997, 82 (11) :5422-5432