共 19 条
- [2] CHEMICAL-ANALYSIS OF INORGANIC AND ORGANIC-SURFACES AND THIN-FILMS BY STATIC TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY (TOF-SIMS) [J]. ANGEWANDTE CHEMIE-INTERNATIONAL EDITION IN ENGLISH, 1994, 33 (10): : 1023 - 1043
- [3] BENNINGHOVEN A, 1993, ANAL CHEM, V65, P630
- [4] Benninghoven A., 1994, ANGEW CHEM, V106, P1075
- [6] ORGANIC FILM THICKNESS EFFECT IN SECONDARY ION MASS-SPECTROMETRY AND PLASMA DESORPTION MASS-SPECTROMETRY [J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1992, 112 (01): : 93 - 100
- [9] FISCHER A, 1985, J COLLOID INTERF SCI, V112, P1
- [10] GALERA R, 1992, SECONDARY ION MASS S, P21