Carbon nanotube tip for scanning tunneling microscope

被引:23
作者
Mizutani, W
Choi, N
Uchihashi, T
Tokumoto, H
机构
[1] Natl Inst Adv Ind Sci & Technol, JRCAT, Tsukuba, Ibaraki 3058562, Japan
[2] Angstrom Technol Partnership, JRCAT, Tsukuba, Ibaraki 3050046, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 2001年 / 40卷 / 6B期
关键词
carbon nanotube (CNT); scanning tunneling microscopy (STM); Au(111) surface reconstruction;
D O I
10.1143/JJAP.40.4328
中图分类号
O59 [应用物理学];
学科分类号
摘要
e attached multiwall carbon nanotubes (CNTs) to the top of a Au tip using a manipulation system, and used the tip as a probe for a scanning tunneling microscope (STM). We measured Au(111) surfaces using an ultrahigh-vacuum-STM with an electrochemically etched Au tip and a multiwall CNT tip attached to the top of the Au tip. When the CNT tip was cleaned by heating in a coil filament, we observed the 22 x root3 reconstruction of clean Au(111). With an uncleaned CNT tip, many adsorbates were observed along the reconstruction, which may be contaminants desorbed from the CNT tip. The stability of the CNT tip depends on its length, diameter and the contact to the base material. Thus far, we have obtained good resolution using a CNT with a length of less than 200 nm. We found that when the CNT was not vertical to the sample surfaces, the tip-surface interaction increased the stability of the CNT tip.
引用
收藏
页码:4328 / 4330
页数:3
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