Fast full-field out-of-plane deformation measurement using fringe reflectometry

被引：43

作者：

Huang, Lei ^{[1
]}

Ng, Chi Seng ^{[1
]}

Asundi, Anand Krishna ^{[1
]}

机构：

[1] Nanyang Technol Univ, Sch Mech & Aerosp Engn, Singapore 639798, Singapore

来源：

OPTICS AND LASERS IN ENGINEERING | 2012年 / 50卷 / 04期

关键词：

Out-of-plane deformation measurement; Phase measuring reflectometry; Computer generated gratings; Windowed Fourier transform; WINDOWED FOURIER-TRANSFORM; PATTERN-ANALYSIS; SHAPE MEASUREMENT; ASPHERIC MIRROR; PROFILOMETRY; PRINCIPLES;

D O I：

10.1016/j.optlaseng.2011.05.006

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Full-field out-of-plane deformation measurement of specular surfaces can be implemented quickly and conveniently using fringe reflectometry. The system configuration is simple and processing is fast. With the assistance of an advanced fringe pattern processing technique, the windowed Fourier ridges method, only a single two-directional fringe pattern is necessary for determination of the deformed surface profile. Thus, the whole measurement only requires a single image with the potential for high speed or even real time measurement. (C) 2011 Elsevier Ltd. All rights reserved.

引用

页码：529 / 533

页数：5

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