Studying nanoscale magnetism and us dynamics with soft X-ray microscopy

被引:17
作者
Fischer, Peter [1 ]
机构
[1] EO Lawrence Berkeley Natl Lab, Ctr Xray Opt, Berkeley, CA 94720 USA
关键词
magnetic soft X-ray microscopy; magnetization reversal; ultrafast spin dynamics; X-ray optics;
D O I
10.1109/TMAG.2008.924532
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Magnetic soft X-ray microscopy allows for imaging magnetic structures at a spatial resolution down to 15 nm and a time resolution in the sub-100 ps regime. Inherent elemental specificity can be used to image the magnetic response of individual components such as layers in multilayered systems. This review highlights current achievements and discusses the future potential of magnetic soft X-ray microscopy at fsec X-ray sources where snapshot images of ultrafast spin dynamics with a spatial resolution below 10 nm will become feasible.
引用
收藏
页码:1900 / 1904
页数:5
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