Rigorous theory for axial resolution in confocal microscopes

被引：45

作者：

Torok, P ^{[1
]}

Wilson, T ^{[1
]}

机构：

[1] UNIV CAMBRIDGE,DEPT ENGN SCI,CAMBRIDGE CB2 3DY,ENGLAND

来源：

OPTICS COMMUNICATIONS | 1997年 / 137卷 / 1-3期

基金：

英国惠康基金;

关键词：

diffraction; high-aperture; focusing; vectorial theory; scanning optical microscopy; confocal microscopy;

D O I：

10.1016/S0030-4018(96)00771-7

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We derive a rigorous theory for the imaging plane reflectors in confocal microscopes. The theory employs a full electromagnetic treatment that is applicable to lenses with high apertures. We show how the polarisation of the illuminating light and the size of either a coherent or an incoherent detector affects the axial resolution of the optical system. Numerical examples are also given for some important cases.

引用

页码：127 / 135

页数：9

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