Fractal analysis of scanning probe microscopy images

被引:102
作者
Almqvist, N
机构
[1] Department of Physics, Luleå University of Technology
关键词
amorphous surfaces; atomic force microscopy; carbon; computer simulations; deuterium; surface structure; morphology; roughness; and topography;
D O I
10.1016/0039-6028(95)01369-5
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The accuracy and precision of several algorithms, including newly developed, for calculating the fractal dimension from scanning probe microscopy images of material surfaces are investigated. The algorithms are based on the area-perimeter method, a variance method or versions of the structure function method. The latter two methods show good correspondence to computer simulated images, with known fractal dimensions, and have successfully been applied also on real images. The results show that these two methods give reliable fractal dimensions and are well suited to describe surface roughness quantitatively.
引用
收藏
页码:221 / 228
页数:8
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