Electron spectrometry at the μeV level and the electron affinities of Si and F

被引：184

作者：

Blondel, C ^{[1
]}

Delsart, C ^{[1
]}

Goldfarb, F ^{[1
]}

机构：

[1] CNRS, Aime Cotton Lab, F-91405 Orsay, France

来源：

JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS | 2001年 / 34卷 / 09期

关键词：

D O I：

10.1088/0953-4075/34/9/101

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Photodetachment microscopy of the negative ions Si- and F- has made it possible to measure the electron affinities of silicon and fluorine with improved accuracy. The new recommended electron affinities of Si-28 and F-19 are 11207.252(18) and 27432.446(19) cm(-1), i.e. 1.3895220(24) and 3.401 1895(25) eV, respectively.

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页码：L281 / L288

页数：8

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