Imaging vesicle adhesion by evanescent wave-induced fluorescence

被引：12

作者：

Bernard, AL

Guedeau-Boudeville, MA

Jullien, L

di Meglio, JM

机构：

[1] Coll France, Lab Phys Mat Condensee, CNRS, URA 792, F-75231 Paris 05, France

[2] Ecole Normale Super, Dept Chim, CNRS, URA 1679, F-75231 Paris, France

[3] Inst Charles Sadron, CNRS, UPR 022, F-67083 Strasbourg, France

来源：

EUROPHYSICS LETTERS | 1999年 / 46卷 / 01期

关键词：

D O I：

10.1209/epl/i1999-00567-2

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We present a new method to study the adsorption of vesicles on solid substrates, combining the use of the evanescent wave-induced fluorescence (EWIF) and classical optical microscopy. We show in this paper that our method can clearly discriminate between a spherical vesicle just touching the substrate and a spread vesicle: this method should thus be useful to design and tailor substrates for controlled adhesion.

引用

页码：101 / 106

页数：6

共 17 条

[1] Adhesion-induced domain formation by interplay of long-range repulsion and short-range attraction force: A model membrane study [J].