Immaterial tip concept by light confinement

被引：25

作者：

Grosjean, T ^{[1
]}

Courjon, D ^{[1
]}

机构：

[1] Inst Microtech Franche Comte, Lab Opt PM Duffieux, UMR 6603, F-25030 Besancon, France

来源：

JOURNAL OF MICROSCOPY-OXFORD | 2001年 / 202卷

关键词：

confinement; lithography; microscopy; near-field optics;

D O I：

10.1046/j.1365-2818.2001.00881.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

It is shown that the combination of TM polarized coherent evanescent light beams can lead to (x, y) confined light distributions. Moreover, owing to the evanescent nature of the interfering beams, the spatial distribution of the square modulus of the electric field does not vary versus the z-distance. Such an energy distribution can be used as a virtual tip, allowing the scanning of a sample without any mechanical contact with it.

引用

页码：273 / 278

页数：6

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