CMOS temperature sensors and built-in test circuitry for thermal testing of ICs

被引：25

作者：

Szekely, V ^{[1
]}

Rencz, M ^{[1
]}

Torok, S ^{[1
]}

Marta, C ^{[1
]}

Liptak-Fego, L ^{[1
]}

机构：

[1] Tech Univ Budapest, Dept Electron Devices, H-1521 Budapest, Hungary

来源：

SENSORS AND ACTUATORS A-PHYSICAL | 1998年 / 71卷 / 1-2期

基金：

匈牙利科学研究基金会;

关键词：

temperature sensors; thermal monitoring; thermal transients measurement; boundary-scan circuitry;

D O I：

10.1016/S0924-4247(98)00165-4

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The paper presents new, CMOS compatible temperature sensors designed for the built-in thermal testing of VLSI circuits. The sensors have been tested by five realizations. Statistical analysis of the measured sensor parameters and the experimental and theoretical investigations in a broad ( -72.5 to +165 degrees C) temperature range are presented. The second part of the paper deals with the application. Experimental results, for example interfacing the sensor with the boundary-scan (BS) test circuitry, on-line thermal monitoring, measuring thermal transients by accessing the sensor via the BS interface, etc., demonstrate the wide usability of the sensor. (C) 1998 Elsevier Science S.A. All rights reserved.

引用

页码：10 / 18

页数：9