Estimation on domain of attraction and convergence rate of Hopfield continuous feedback neural networks

被引：33

作者：

Cao, JD ^{[1
]}

Tao, Q

机构：

[1] Southeast Univ, Dept Appl Math, Nanjing 210096, Peoples R China

[2] Yunnan Univ, Adult Educ Coll, Kunming 650091, Peoples R China

来源：

JOURNAL OF COMPUTER AND SYSTEM SCIENCES | 2001年 / 62卷 / 03期

关键词：

Lyapunov method; Hopfield neural network; domain of attraction; exponential convergence rate;

D O I：

10.1006/jcss.2000.1722

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

In this paper, some new estimation results on the domain of attraction of memory patterns and exponential convergence rate of the network trajectories to memory patterns for Hopfield continuous associative memory are obtained. These results can be used for the evaluation of fault-tolerance capability and the synthesis procedures for Hopfield continuous feedback associative memory neural networks. (C) 2001 Academic Press.

引用

页码：528 / 534

页数：7

共 11 条

[1] AN ANALOG FEEDBACK ASSOCIATIVE MEMORY [J].

ATIYA, A ;

ABUMOSTAFA, YS .

IEEE TRANSACTIONS ON NEURAL NETWORKS, 1993, 4 (01) :117-126

[2]

CAO J, 1999, INFORM CONTR, V28, P488

[3]

CAO J, 1999, J ELECT, V21, P332

[4] Estimation of the domain of attraction and the convergence rate of a Hopfield associative memory and an application [J].

Cao, JD ;

Tao, Q .

JOURNAL OF COMPUTER AND SYSTEM SCIENCES, 2000, 60 (01) :179-186

[5]

Cao JD, 1998, 3RD INTERNATIONAL CONFERENCE ON NONLINEAR MECHANICS, P764

[6] A SYNTHESIS PROCEDURE FOR HOPFIELD CONTINUOUS-TIME ASSOCIATIVE MEMORY [J].

FARRELL, JA ;

MICHEL, AN .

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS, 1990, 37 (07) :877-884

[7] NEURONS WITH GRADED RESPONSE HAVE COLLECTIVE COMPUTATIONAL PROPERTIES LIKE THOSE OF 2-STATE NEURONS [J].

HOPFIELD, JJ .

PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA-BIOLOGICAL SCIENCES, 1984, 81 (10) :3088-3092

[8]

LIANG XB, 1996, J ELECT, V18, P1

[9]

Liang Xuebin, 1996, Acta Electronica Sinica, V24, P40

[10]

Michel A. N., 1990, IEEE Control Systems Magazine, V10, P6, DOI 10.1109/37.55118

← 1 2 →