High resolution I-DDQ characterization and testing - Practical issues

I-DDQ testing has become an important contributor to quality improvement of CMOS ICs. This paper describes high resolution I-DDQ characterization and testing (from the sub-nA to mu A level) and outlines test hardware and software issues. The physical basis of I-DDQ is discussed. Methods for statistical analysis of I-DDQ data are examined, as interpretation of the data is often as important as the measurement itself. Applications of these methods to set reasonable test limits for detecting defective product are demonstrated.