Realistic detection limits from confidence bands

被引：22

作者：

Burdge, JR ^{[1
]}

MacTaggart, DL

Farwell, SO

机构：

[1] Univ Akron, Dept Chem, Akron, OH 44325 USA

[2] S Dakota Sch Mines & Technol, Grad Off, Rapid City, SD 57701 USA

来源：

JOURNAL OF CHEMICAL EDUCATION | 1999年 / 76卷 / 03期

关键词：

D O I：

10.1021/ed076p434

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

[No abstract available]

引用

页码：434 / 439

页数：6

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