GHz counting rate NbN single-photon detector for IR diagnostics of VLSI CMOS circuits

被引:24
作者
Korneev, A
Lipatov, A
Okunev, O
Chulkova, G
Smirnov, K
Gol'tsman, G
Zhang, J
Slysz, W
Verevkin, A
Sobolewski, R
机构
[1] Moscow State Pedag Univ, Dept Phys, Moscow 119992, Russia
[2] Univ Rochester, Dept Elect & Comp Engn, Rochester, NY 14627 USA
[3] Univ Rochester, Laser Energet Lab, Rochester, NY 14627 USA
关键词
single-photon detector; integrated circuits diagnostics; superconducting NbN films;
D O I
10.1016/S0167-9317(03)00309-5
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We present a new, simple to manufacture superconducting single-photon detector operational in the range from ultraviolet to mid-infrared radiation wavelengths. The detector combines GHz counting rate, high quantum efficiency and very low level of dark (false) counts. At 1.3-1.5 mum wavelength range our detector exhibits a quantum efficiency of 5-10%. The detector photoresponse voltage pulse duration was measured to be about 150 ps with jitter of 35 ps and both of them were limited mostly by our measurement equipment. In terms of quantum efficiency, dark counts level, speed of operation the detector surpasses all semiconductor counterparts and was successfully applied for CMOS integrated circuits diagnostics. (C) 2003 Elsevier B.V. All rights reserved.
引用
收藏
页码:274 / 278
页数:5
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