Deposition of biaxially-oriented metal and oxide buffer-layer films on textured Ni tapes: New substrates for high-current, high-temperature superconductors

被引：107

作者：

He, Q ^{[1
]}

Christen, DK ^{[1
]}

Budai, JD ^{[1
]}

Specht, ED ^{[1
]}

Lee, DF ^{[1
]}

Goyal, A ^{[1
]}

Norton, DP ^{[1
]}

Paranthaman, M ^{[1
]}

List, FA ^{[1
]}

Kroeger, DM ^{[1
]}

机构：

[1] OAK RIDGE NATL LAB,OAK RIDGE,TN 37831

来源：

PHYSICA C | 1997年 / 275卷 / 1-2期

关键词：

applications of high-T-c; superconductors; grain alignment (texturing); multilayers; thin films;

D O I：

10.1016/S0921-4534(96)00705-8

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Techniques are reported for sputter deposition of biaxially oriented buffer-layers on textured Ni tapes. These buffered tapes can be employed as long, flexible, or large area substrates for biaxially-aligned high-temperature superconductors (HTS) with high critical current density J(c). Using deposition techniques at temperatures as low as 25 degrees C, epitaxial Pd or Pt films were first deposited as a base layer on the textured Ni tapes, followed by deposition of biaxially oriented Ag or CeO2 buffer layers. Using Ar/4%H-2 sputter gas, biaxially oriented CeO2 films were also grown directly on the textured Ni tapes, followed by the epitaxial growth of YSZ films. All the films show both strong in-plane and out-of-plane orientations. The effects of Ni surface smoothness on buffer-layer texture were also investigated.

引用

页码：155 / 161

页数：7

共 8 条

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