TFEL devices using oxide thin films without vacuum process

被引:10
作者
Minami, T [1 ]
Miyata, T [1 ]
Sakagami, Y [1 ]
机构
[1] Kanazawa Inst Technol, Elect Device Syst Lab, Nonoichi, Ishikawa 921, Japan
关键词
thin-film electroluminescent device; dip-coating; electroluminescence; phosphor; Ga2O3; ZnGa2O4; CaGa2O4;
D O I
10.1016/S0257-8972(98)00591-X
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Thin-film electroluminescent (TFEL) device fabrication using solution coating techniques which eliminate the need for vacuum processes have been demonstrated. The oxide phosphor thin-film emitting layer and the transparent conducting oxide thin-film electrode were prepared by this less expensive deposition process using metallic complex salts which are low in cost and easy to handle. TFEL devices with dip-coated ZnGa2O4:Mn, Ga2O3:Mn and CaGa2O4:Mn phosphor thin films were compared to devices with sputtered phosphor thin films. TFEL devices with a dip-coated ZnGa2O4:Mn or Ga2O3:Mn thin-film emitting layer exhibited higher luminance than equivalent devices with sputtered thin-film emitting layers. a luminance maximum above 750 or 1000 cd/m(2) in green emission, respectively, when driven at 1 kHz. (C) 1998 Elsevier Science S.A. All rights reserved.
引用
收藏
页码:594 / 598
页数:5
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