Plane-grating flat-field soft x-ray spectrometer

We describe a soft x-ray spectrometer covering the 120-800 eV range. It is intended for resonant inelastic x-ray scattering experiments performed at third generation synchrotron radiation (SR) facilities and has been developed with SOLEIL, the future French national SR source in mind. The Hettrick-Underwood principle is at the heart of the design using a combination of varied line-spacing plane grating and spherical-mirror to provide a flat-field image. It is slitless for optimum acceptance. This means the source size determines the resolving power. A spot size of less than or equal to5 mum is planned at SOLEIL which, according to simulations, should ensure a resolving power greater than or equal to1000 over the whole energy range. A 1024x1024 pixel charge-coupled device (CCD) with a 13 mumx13 mum pixel size is used. This is an improvement on the use of microchannel-plate detectors, both as concerns efficiency and spatial resolution. Additionally spectral line curvature is avoided by the use of a horizontal focusing mirror concentrating the beam in the nondispersing direction. It allows for readout using a binning mode to reduce the intrinsically large CCD readout noise. Preliminary results taken at beamlines at Elettra (Trieste) and at BESSY (Berlin) are presented. (C) 2005 American Institute of Physics.