Damping mechanism in dynamic force microscopy

被引：41

作者：

Gauthier, M ^{[1
]}

Tsukada, M ^{[1
]}

机构：

[1] Univ Tokyo, Grad Sch Sci, Dept Phys, Bunkyo Ku, Tokyo 1130033, Japan

来源：

PHYSICAL REVIEW LETTERS | 2000年 / 85卷 / 25期

关键词：

D O I：

10.1103/PhysRevLett.85.5348

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

A general theory is presented which describes the damping in dynamic force microscopy due to the proximity of the surface, consistently with resonant frequency shift effects. Orders of magnitude for the experimentally measured "dissipation" and image corrugation are reproduced. It is suggested that the damping does not mainly result from energy dissipation, but arises because not all solutions of the microlever equation of motion are accessible. The damping is related to the multivalued nature of the analytical resonance curve, which appears at some critical tip-surface separation.

引用

页码：5348 / 5351

页数：4

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