Low temperature scanning tunneling microscope-induced luminescence of GaN

被引:7
作者
Evoy, S [1 ]
Harnett, CK
Craighead, HG
Eustis, TJ
Davis, WA
Murphy, MJ
Schaff, WJ
Eastman, LF
机构
[1] Cornell Univ, Sch Appl & Engn Phys, Ithaca, NY 14853 USA
[2] Cornell Univ, Dept Mat Sci & Engn, Ithaca, NY 14853 USA
[3] Cornell Univ, Sch Elect Engn, Ithaca, NY 14853 USA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1998年 / 16卷 / 04期
关键词
D O I
10.1116/1.590112
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We report the low temperature scanning tunneling microscope-induced luminescence of molecular beam epitaxy grown alpha-GaN. Semiquantitative spectroscopic analysis suggests near band edge emission, as well as emission covering the rest of the visible range. The relative intensity of band edge emission increases by one order of magnitude under liquid helium cooling. We also report the first photon emission images of GaN obtained with this technique. These images reveal stronger band edge emission at the center of crystallites. This study is complemented with a scanning electron microscope-induced cathodoluminescence analysis. Cathodoluminescence is dominated by the hexagonal (D degrees, X) transition and reveals evidence of small quantities of the cubic phase. (C) 1998 American Vacuum Society.
引用
收藏
页码:1943 / 1947
页数:5
相关论文
共 24 条
[1]   NANOMETER RESOLUTION IN LUMINESCENCE MICROSCOPY OF III-V HETEROSTRUCTURES [J].
ABRAHAM, DL ;
VEIDER, A ;
SCHONENBERGER, C ;
MEIER, HP ;
ARENT, DJ ;
ALVARADO, SF .
APPLIED PHYSICS LETTERS, 1990, 56 (16) :1564-1566
[2]   Pulsed operation lasing in a cleaved-facet InGaN/GaN MQW SCH laser grown on 6H-SiC [J].
Bulman, GE ;
Doverspike, K ;
Sheppard, ST ;
Weeks, TW ;
Kong, HS ;
Dieringer, HM ;
Edmond, JA ;
Brown, JD ;
Swindell, JT ;
Schetzina, JF .
ELECTRONICS LETTERS, 1997, 33 (18) :1556-1557
[3]  
Garni B, 1996, APPL PHYS LETT, V68, P1380, DOI 10.1063/1.116086
[4]   CATHODOLUMINESCENCE OF MOVPE-GROWN GAN LAYER ON ALPHA-AL2O3 [J].
HIRAMATSU, K ;
AMANO, H ;
AKASAKI, I .
JOURNAL OF CRYSTAL GROWTH, 1990, 99 (1-4) :375-380
[5]   Properties of the yellow luminescence in undoped GaN epitaxial layers [J].
Hofmann, DM ;
Kovalev, D ;
Steude, G ;
Meyer, BK ;
Hoffmann, A ;
Eckey, L ;
Heitz, R ;
Detchprom, T ;
Amano, H ;
Akasaki, I .
PHYSICAL REVIEW B, 1995, 52 (23) :16702-16706
[6]   HIGH DISLOCATION DENSITIES IN HIGH-EFFICIENCY GAN-BASED LIGHT-EMITTING-DIODES [J].
LESTER, SD ;
PONCE, FA ;
CRAFORD, MG ;
STEIGERWALD, DA .
APPLIED PHYSICS LETTERS, 1995, 66 (10) :1249-1251
[7]   STM excited electroluminescence of GaN microcrystals [J].
Liebheit, A ;
Schwartzkopff, M ;
Radojkovic, P ;
Hartmann, E ;
Hechtl, E ;
PetrovaKoch, V ;
Koch, F .
JOURNAL OF LUMINESCENCE, 1997, 72-4 :994-996
[8]  
Lindahl J, 1996, APPL PHYS LETT, V68, P60, DOI 10.1063/1.116757
[9]  
MACK MP, MAR RES SOC INTERNET, V2
[10]   GEOMETRIC AND ELECTRONIC-STRUCTURE OF ANTIMONY ON THE GAAS(110) SURFACE STUDIED BY SCANNING TUNNELING MICROSCOPY [J].
MARTENSSON, P ;
FEENSTRA, RM .
PHYSICAL REVIEW B, 1989, 39 (11) :7744-7753