Scanning transmission x-ray microscopy with a configurable detector

被引：106

作者：

Gianoncelli, A.

Morrison, G. R.

Kaulich, B.

Bacescu, D.

Kovac, J.

机构：

[1] Kings Coll London, Dept Phys, London WC2R 2LS, England

[2] Sincrotrone Trieste, I-34012 Trieste, Italy

[3] Jozef Stefan Inst, Ljubljana 1000, Slovenia

来源：

APPLIED PHYSICS LETTERS | 2006年 / 89卷 / 25期

关键词：

D O I：

10.1063/1.2422908

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A configurable charge-coupled-device (CCD) detector is used in a scanning transmission x-ray microscope to record the transmitted intensity distribution for every pixel in a raster scan of the sample. Real-time processing of the CCD frames gives simultaneous absorption and phase contrast image signals from a single scan. The CCD combines fast frame-transfer readout with very high sensitivity and makes use of x-ray to visible-light coupling to allow operation over a wide range of photon energies, from the oxygen K edge upwards. Tests on the Twinmic end station at the Elettra synchrotron are reported. (c) 2006 American Institute of Physics.

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页数：3

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