Diagnostics of "colossal" magnetoresistance manganite films by Raman spectroscopy

被引:49
作者
Podobedov, VB [1 ]
Romero, DB
Weber, A
Rice, JP
Schreekala, R
Rajeswari, M
Ramesh, R
Venkatesan, T
Drew, HD
机构
[1] Natl Inst Stand & Technol, Gaithersburg, MD 20899 USA
[2] Russian Acad Sci, Inst Spect, Troitsk 142092, Moscow Region, Russia
[3] Univ Maryland, Dept Phys, College Pk, MD 20742 USA
关键词
D O I
10.1063/1.122723
中图分类号
O59 [应用物理学];
学科分类号
摘要
Polarized Raman scattering by phonons is used to characterize thin films prepared by laser ablation of La1-xCaxMnO3 targets. It was found that, in the temperature range from 6 to 300 K, phonon spectra of La0.7Ca0.3MnO3 films exhibit observable differences from those in bulk materials (microcrystalline ceramics and single crystals). A significant difference was found in the spectra of "as-grown'' films compared to those annealed in oxygen at 800 degrees C. The observed Raman peaks and their linewidths exhibit an irregular temperature dependence near T-c. A correlation of Raman data with magnetization of the sample was also found. (C) 1998 American Institute of Physics. [S0003-6951(98)03048-4].
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页码:3217 / 3219
页数:3
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