Fast triggering in silicon drift detectors by means of holes' induction

被引：12

作者：

Castoldi, A

Gatti, E

Guazzoni, C

机构：

[1] Politecn Milan, Dipartimento Elettron & Informaz, I-20133 Milan, Italy

[2] Politecn Milan, Dipartimento Ingn Nucl CeSNEF, I-20133 Milan, Italy

[3] Ist Nazl Fis Nucl, Sez Milano, I-20133 Milan, Italy

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2004年 / 518卷 / 1-2期

关键词：

self-triggering; silicon drift detectors; controlled drift detectors; fast event coincidence; x-ray imaging; Compton telescope;

D O I：

10.1016/j.nima.2003.11.049

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The signal induced by electrons and holes on the p(+) strips close to the interaction point can provide a very precise time mark of the photon interaction in a Silicon Drift Detector (SDD). A detailed study of the shape of the induced signals and of the parameters affecting the achievable time resolution is presented together with the first experimental tests on a linear SDD. The measured time resolution of the trigger signal is 1.5 ns r.m.s.. Such a fast trigger makes possible the use of SDDs as high resolution X-ray imagers and opens to the development of novel Compton telescopes for gamma-ray imaging based on Controlled Drift Detectors. (C) 2003 Elsevier B.V. All rights reserved.

引用

页码：429 / 432

页数：4

共 5 条

[1] Room-temperature 2-D X-ray imaging with the controlled-drift detector [J].