Monolayer resolution in medium energy ion scattering

被引：12

作者：

Bailey, P ^{[1
]}

Noakes, TCQ

Baddeley, CJ

Tear, SP

Woodruff, DP

机构：

[1] CLRC, Daresbury Lab, Warrington WA4 4AD, Cheshire, England

[2] Univ St Andrews, Sch Chem, St Andrews KY16 9ST, Fife, Scotland

[3] Univ York, Dept Phys, York YO10 5DD, N Yorkshire, England

[4] Univ Warwick, Dept Phys, Coventry CV4 7AL, W Midlands, England

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2001年 / 183卷 / 1-2期

基金：

英国工程与自然科学研究理事会;

关键词：

medium energy ion scattering; high resolution; surface structures; surface composition;

D O I：

10.1016/S0168-583X(01)00384-6

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Although medium energy ion scattering (MEIS) could be considered to be a mature technique, it continues to find new applications and new methodologies, especially in exploiting the monolayer resolution capabilities. In this paper we consider four applications which provide information with monolayer resolution and illustrate each with a practical example. (C) 2001 Elsevier Science B.V. All rights reserved.

引用

页码：62 / 72

页数：11

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