Observation of superconducting device using magnetic imaging system with a micro-DC superconducting quantum interference device magnetometer

被引：25

作者：

Morooka, T ^{[1
]}

Nakayama, S ^{[1
]}

Odawara, A ^{[1
]}

Chinone, K ^{[1
]}

机构：

[1] Seiko Instruments Inc, Matsudo, Chiba 2702222, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1999年 / 38卷 / 2A期

关键词：

scanning SQUID microscopy; high spatial resolution; observation of a superconducting device; trapped flux; Meissner effect; shielding current;

D O I：

10.1143/JJAP.38.L119

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A magnetic imaging system with a micro-DC superconducting quantum interference device magnetometer has been developed to evaluate superconducting films and to inspect a superconducting device with a high spatial resolution. A superconducting device, i.e., a DC-SQUID made of a superconducting Nb thin film, was observed using the system. The shape of the device was identified by applying the Meissner effect. The trapped fluxes in the device were clearly visible. In addition, the input current and the shielding current flowing on the device were detected by feeding a current to the device. It was confirmed experimentally that the magnetic imaging system was effective in studying superconducting devices.

引用

页码：L119 / L122

页数：4

共 7 条

[1] EASY PROCESS FOR FABRICATION OF HIGH-RELIABILITY DC-SQUIDS [J].