Improvement of the short-circuit current density and efficiency in micromorph tandem solar cells by an anti-reflection layer

被引:10
作者
Chang, Ping-Kuan [1 ]
Hsieh, Po-Tsung [2 ]
Tsai, Fu-Ji [3 ]
Lu, Chun-Hsiung [3 ]
Yeh, Chih-Hung [3 ]
Houng, Mau-Phon [1 ]
机构
[1] Natl Cheng Kung Univ, Dept Elect Engn, Inst Microelect, Tainan 701, Taiwan
[2] Natl Cheng Kung Univ, Ctr Micro Nano Sci & Technol, Tainan 701, Taiwan
[3] NexPower Technol Corp, Taichung 421, Taiwan
关键词
Anti-reflection layer; Short-circuit current; Tandem solar cell; Conversion efficiency; Plasma enhanced chemical vapor deposition; GLASS;
D O I
10.1016/j.tsf.2011.06.086
中图分类号
T [工业技术];
学科分类号
120111 [工业工程];
摘要
An anti-reflection layer has been fabricated and applied in micromorph tandem (a-Si:H/mu c-Si:H) solar cells. In this work, the porous anti-reflection layers are produced on glass substrates by plasma enhanced chemical vapor deposition using a CF(4) and O(2) gas mixture. The process is simple and easily controlled. The tandem solar cells with the anti-reflection layer show the increased short-circuit current density of the solar cells due to increased light transmittance from air/glass interface. With the anti-reflection layer, the short-circuit current density of the tandem cell increases by 0.29 mA/cm(2). Meanwhile, the solar cell efficiency increases from 11.15% to 11.55% (3.5% in relative) which allows us to develop more efficient a-Si based solar cells. (C) 2011 Elsevier B.V. All rights reserved.
引用
收藏
页码:550 / 553
页数:4
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