Probing the surface forces of atomic layered SrTiO3 films by atomic force microscopy

被引：18

作者：

Tanaka, H ^{[1
]}

Tabata, N ^{[1
]}

Kawai, T ^{[1
]}

机构：

[1] Osaka Univ, Inst Sci & Ind Res, Ibaraki, Osaka 5670047, Japan

来源：

THIN SOLID FILMS | 1999年 / 342卷 / 1-2期

关键词：

atomic force microscopy; surface forces; perovskites;

D O I：

10.1016/S0040-6090(98)01459-X

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The atomic configuration and chemical properties of two types of SrTiO3 (001) surfaces, SrO or TiO2 terminated surface formed by laser molecular beam epitaxy (MBE), have been investigated using atomic force microscopy (AFM) with a surface modified tip. Both terminated surfaces have a terrace structure consisting of an atomically flat plane and steps of height 4 Angstrom corresponding to the unit cell step. When measured using a TiO2 coated tip, the friction force of the SrO terminated surface was found to be larger than that of the TiO2 terminated surface. This suggests that the friction force is caused by the bonding energy present at the interface, which provides a method for measuring the chemical energy present in oxide materials on the nanometer order between the surface and the tip of an atomic force microscope. (C) 1999 Elsevier Science S.A. All rights reserved.

引用

页码：4 / 7

页数：4

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