Unpolarized calibration and nonuniformity correction for long-wave infrared microgrid imaging polarimeters

被引:31
作者
Bowers, David L. [1 ]
Boger, James K. [1 ]
Wellems, L. David [1 ]
Ortega, Steve E. [1 ]
Fetrow, Matthew P.
Hubbs, John E. [2 ,3 ]
Black, Wiley T. [4 ]
Ratliff, Bradley M. [4 ]
Tyo, J. Scott [4 ]
机构
[1] Appl Technol Assoc, Albuquerque, NM 87123 USA
[2] USAF, Res Lab, VSSS, Infrared Radiat Effects Lab, Kirtland AFB, NM 87117 USA
[3] Ball Aerosp & Technol Corp, Albuquerque, NM 87185 USA
[4] Univ Arizona, Ctr Opt Sci, Tucson, AZ 85721 USA
基金
美国国家科学基金会;
关键词
infrared polarimetry; polarimeter; microgrid polarimeters;
D O I
10.1117/1.2911715
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Recent developments for long-wave infrared (LWIR) imaging polarimeters include incorporating a microgrid polarizer array onto the focal plane array. Inherent advantages over other classes of polarimeters include rugged packaging, inherent alignment of the optomechanical system, and temporal synchronization that facilitates instantaneous acquisition of both thermal and polarimetric information. On the other hand, the pixel-to-pixel instantaneous field-of-view error that is inherent in the microgrid strategy leads to false polarization signatures. Because of this error, residual pixel-to-pixel variations in the gain-corrected responsivity, the noise-equivalent input, and variations in the pixel-to-pixel micropolarizer performance are extremely important. The degree of linear polarization is highly sensitive to these parameters and is consequently used as a metric to explore instrument sensitivities. We explore the unpolarized calibration issues associated with this class of LWIR polarimeters and discuss the resulting false polarization signature for thermally flat test scenes. (C) 2008 Society of Photo-Optical Instrumentation Engineers.
引用
收藏
页数:9
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