Dynamically figured Kirkpatrick Baez x-ray micro-focusing optics

被引：107

作者：

Eng, PJ ^{[1
]}

Newville, M ^{[1
]}

Rivers, ML ^{[1
]}

Sutton, SR ^{[1
]}

机构：

[1] Univ Chicago, CARS, Chicago, IL 60637 USA

来源：

X-RAY MICROFOCUSING: APPLICATIONS AND TECHNIQUES | 1998年 / 3449卷

关键词：

micro-focusing; x-ray mirror; Kirkpatrick-Baez; micro-beam; microprobe; microspectroscopy;

D O I：

10.1117/12.330342

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We present the optical designs, modeling, bender design and test results of x-ray micro-focusing optics used to micro-focus monochromatic undulator x-rays at the Advanced Photon Source (APS) The system uses two 100mm long, actively bent mirrors in a Kirkpatrick Baez arrangement. A detailed analytical model of the system's performance is described along with ray tracing results. A description of the integration of the benders into a complete micro-focusing system is provided. The system is easy to setup and use and is presently used in earth science research coupled to techniques such as micro-spectroscopy, fluorescence microprobe, and energy dispersive diffraction. The optics' performance is measured on the GeoSoilEnviroCARS microprobe experimental station at APS sector 13. Focusing tests using 10keV undulator x-rays resulted in a double focused beam with a horizontal and vertical full width at half maximum of 0.80 mu m x 0.85 mu m, and flux density gain greater than 10(5).

引用

页码：145 / 156

页数：12