Characterization of the resist chemistry and related processes within several of Shipley's new experimental positive deep UV resists is reported. These resists are unique in that they function by a combination of acid catalyzed deprotection and conversion of a dissolution inhibiting photoacid generator. The resist chemistry is characterized in terms of deblocking efficiency, acid generating efficiency and changes in dissolution rate. In addition, a knowledge of both the deblocking and acid generating efficiency within these resists allowed the catalytic chain length and deprotection volume to be calculated for each resist.