Characterization of Shipley's positive deep UV experimental resists: Deblocking studies

被引:7
作者
Cameron, JF
Orellana, AJ
Rajaratnam, MM
Sinta, RF
机构
来源
ADVANCES IN RESIST TECHNOLOGY AND PROCESSING XIII | 1996年 / 2724卷
关键词
resist chemistry; deep UV photoresists; deblocking efficiency; acid generating efficiency;
D O I
10.1117/12.241824
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Characterization of the resist chemistry and related processes within several of Shipley's new experimental positive deep UV resists is reported. These resists are unique in that they function by a combination of acid catalyzed deprotection and conversion of a dissolution inhibiting photoacid generator. The resist chemistry is characterized in terms of deblocking efficiency, acid generating efficiency and changes in dissolution rate. In addition, a knowledge of both the deblocking and acid generating efficiency within these resists allowed the catalytic chain length and deprotection volume to be calculated for each resist.
引用
收藏
页码:261 / 272
页数:12
相关论文
empty
未找到相关数据