Thermal diffusivity measurements in glass and Teflon using photopyroelectric signal spectral analysis and correlation techniques

被引:7
作者
Bonno, B
Laporte, JL
dLeon, RT
机构
[1] Lab. d'Optique Moléculaire, Université de Reims
关键词
D O I
10.1063/1.1147068
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Thermal diffusivity measurements in glass and Teflon are reported over the temperature range from 90 to 300 K. The results are obtained by multifrequency rear surface excitation combined with impulse response determination using correlation photopyroelectric techniques. A simple and versatile computer-based system performing generation of given excitation wave forms, data acquisition, and analysis is described. A one-dimensional model is proposed in order to explain the experimental results. (C) 1996 American Institute of Physics.
引用
收藏
页码:3616 / 3620
页数:5
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