Determination of absolute structure using Bayesian statistics on Bijvoet differences

被引:653
作者
Hooft, Rob W. W. [1 ]
Straver, Leo H. [1 ]
Spek, Anthony L. [2 ]
机构
[1] Bruker AXS, NL-2600 AV Delft, Netherlands
[2] Univ Utrecht, Bijvoet Ctr Biomol Res, NL-3584 CH Utrecht, Netherlands
关键词
D O I
10.1107/S0021889807059870
中图分类号
O6 [化学];
学科分类号
0703 [化学];
摘要
A new probabilistic approach is introduced for the determination of the absolute structure of a compound which is known to be enantiopure based on Bijvoet-pair intensity differences. The new method provides relative probabilities for different models of the chiral composition of the structure. The outcome of this type of analysis can also be cast in the form of a new value, along with associated standard uncertainty, that resembles the value of the well known Flack x parameter. The standard uncertainty we obtain is often about half of the standard uncertainty in the value of the Flack x parameter. The proposed formalism is suited in particular to absolute configuration determination from diffraction data of biologically active (pharmaceutical) compounds where the strongest resonant scattering signal often comes from oxygen. It is shown that a reliable absolute configuration assignment in such cases can be made on the basis of Cu K alpha data, and in some cases even with carefully measured Mo K alpha data.
引用
收藏
页码:96 / 103
页数:8
相关论文
共 27 条
[2]
[Anonymous], 2004, SAINT
[3]
BEURSKENS G, 1980, CRYST STRUCT COMMUN, V9, P23
[4]
Beurskens P.T., 1999, DIRDIF99
[5]
DETERMINATION OF THE ABSOLUTE CONFIGURATION OF OPTICALLY ACTIVE COMPOUNDS BY MEANS OF X-RAYS [J].
BIJVOET, JM ;
PEERDEMAN, AF ;
VANBOMMEL, AJ .
NATURE, 1951, 168 (4268) :271-272
[6]
Invarioms for improved absolute structure determination of light-atom crystal structures [J].
Dittrich, B ;
Strumpel, M ;
Schäfer, M ;
Spackman, MA ;
Koritsánszky, T .
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2006, 62 :217-223
[7]
An intensity evaluation method:: EVAL-14 [J].
Duisenberg, AJM ;
Kroon-Batenburg, LMJ ;
Schreurs, AMM .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2003, 36 :220-229
[8]
DETERMINATION OF ABSOLUTE CONFIGURATION AND DELTAF'' VALUES FOR LIGHT-ATOM STRUCTURES [J].
ENGEL, DW .
ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL CRYSTALLOGRAPHY AND CRYSTAL CHEMISTRY, 1972, B 28 (MAY15) :1496-&
[9]
Centrosymmetric and pseudo-centrosymmetric structures refined as non-centrosymmetric [J].
Flack, H. D. ;
Bernardinelli, G. ;
Clemente, D. A. ;
Linden, A. ;
Spek, A. L. .
ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE, 2006, 62 :695-701
[10]
Reporting and evaluating absolute-structure and absolute-configuration determinations [J].
Flack, HD ;
Bernardinelli, G .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2000, 33 :1143-1148