XPS study of siloxane plasma polymer films

Plasma polymer films were deposited from hexamethyldisiloxane (HMDSO), dichloro(methyl)phenylsilane (DCMPS) and vinyltriethoxysilane (VTEO) on polished silicon wafers using a RF helical coupling deposition system. The composition of elements in the surface region (top 6-8 nm) of the deposited films was studied by X-ray-induced photoelectron spectroscopy (XPS) on an ADES 400 VG Scientific photoelectron spectrometer using MgKalpha (1253.6 eV) or AlKalpha (1486.6 eV) photon beams at the normal emission angle. Aging effects of plasma-polymerized (PP) HMDSO and DCMPS films stored under standard laboratory conditions were investigated by employing XPS. Post-deposition contamination and oxidation of pp-DCMPS and pp-HMDSO film was carefully observed. An increase in oxygen atoms on the film surface over time is accompanied by changes in bulk atomic concentrations. Sequential sputtering with an Ar ion-beam, together with XPS analysis, was used to measure concentration depth profiles in pp-HMDSO and pp-DCMPS films. (C) 2003 Elsevier Science B.V. All rights reserved.