Dependence of polarization on epitaxial strain in ferroelectric ultrathin films from first principles

被引：13

作者：

Bin-Omran, S. ^{[1
]}

Ponomareva, I. ^{[1
]}

Bellaiche, L. ^{[1
]}

机构：

[1] Univ Arkansas, Dept Phys, Fayetteville, AR 72701 USA

来源：

PHYSICAL REVIEW B | 2008年 / 77卷 / 14期

关键词：

D O I：

10.1103/PhysRevB.77.144105

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

First-principles-based methods are used to determine the response of polarization to epitaxial strain in films made of BaTiO3 (BT) and Pb(Zr0.5Ti0.5)O-3 (PZT). Unlike in BT films, the strength of this response as well as its sign dramatically depend on the film's thickness and electrical boundary conditions in PZT films. A phenomenological model provides a rationale for these findings.

引用

页数：6

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