Photosensitive polymer thin-film FETs based on poly(3-octylthiophene)

被引:39
作者
Deen, MJ [1 ]
Kazemeini, MH [1 ]
机构
[1] McMaster Univ, Dept Elect & Comp Engn, Hamilton, ON L8S 4K1, Canada
关键词
conjugated polymer transistors; contact resistance; photodetector; phototransistor; poly(3-octylthiophene) (P3OT) phototransistor; poly(3-octylthiophene) (P3OT) transistor; polymer FET; polymer thin-film transistor (TFT); space-charge limited conduction; trap-limited conduction;
D O I
10.1109/JPROC.2005.850300
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The effects of white light on the electrical performance of polymer thin-film transistors (PTFTs) based on regioregular poly(3-octylthiophene) (P3OT) are investigated. Upon illumination, a significant increase in the PFET's drain current is observed with a maximum photosensitivity of 104 in the subthreshold operation and a broad-band responsivity with a maximum value of 160 mA/W at irradiance of 1.7 mW/cm(2) and at low gate biases. The photosensitivity decreases with the increase in the absolute gate bias. The simultaneous control of the device with both the gate voltage and illumi- nation is possible at low irradiances of < 0.7m mW/cm(2). It is found that the illumination effectively decreases the threshold voltage of the device, but it does not change the field-effect mobility. Using a trap model, it is shown that the narrow layers close to the drain and source contacts with high concentratiops of defects are two possible regions for photogeneration of excitons and separation of charges. Using the theory of space-charge limited conduction, the extracted band mobility for P3OT is 0.08 cm(2)/V. S, while a mobility of 8 x 10(-5) cm(2) / V(.)s is found for the regions next to the source and drain contacts. The PTFT's high photosensitivity at zero gate voltage suggests a simple design of low-voltage, high-sensitivily rwo-terminal photodetectors for applications in large-area flexible optoelectronis.
引用
收藏
页码:1312 / 1320
页数:9
相关论文
共 35 条
[1]   REVERSIBLE CHARGE-TRANSFER COMPLEXES BETWEEN MOLECULAR-OXYGEN AND POLY(3-ALKYLTHIOPHENE)S [J].
ABDOU, MSA ;
ORFINO, FP ;
XIE, ZW ;
DEEN, MJ ;
HOLDCROFT, S .
ADVANCED MATERIALS, 1994, 6 (11) :838-841
[2]   NATURE OF IMPURITIES IN PI-CONJUGATED POLYMERS PREPARED BY FERRIC-CHLORIDE AND THEIR EFFECT ON THE ELECTRICAL-PROPERTIES OF METAL-INSULATOR-SEMICONDUCTOR STRUCTURES [J].
ABDOU, MSA ;
LU, XT ;
XIE, ZW ;
ORFINO, F ;
DEEN, MJ ;
HOLDCROFT, S .
CHEMISTRY OF MATERIALS, 1995, 7 (04) :631-641
[3]   COMPARISON OF THE DRIFT MOBILITY MEASURED UNDER TRANSIENT AND STEADY-STATE CONDITIONS IN A PROTOTYPICAL HOPPING SYSTEM [J].
ABKOWITZ, M ;
PAI, DM .
PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1986, 53 (03) :193-216
[4]   ENHANCED CARRIER PHOTOGENERATION BY DEFECTS IN CONJUGATED POLYMERS AND ITS MECHANISM [J].
ANTONIADIS, H ;
ROTHBERG, LJ ;
PAPADIMITRAKOPOULOS, F ;
YAN, M ;
GALVIN, ME ;
ABKOWITZ, MA .
PHYSICAL REVIEW B, 1994, 50 (20) :14911-14915
[5]   FIELD-EFFECT MOBILITY OF POLY(3-HEXYLTHIOPHENE) [J].
ASSADI, A ;
SVENSSON, C ;
WILLANDER, M ;
INGANAS, O .
APPLIED PHYSICS LETTERS, 1988, 53 (03) :195-197
[6]   Fabrication of 70 nm channel length polymer organic thin-film transistors using nanoimprint lithography [J].
Austin, MD ;
Chou, SY .
APPLIED PHYSICS LETTERS, 2002, 81 (23) :4431-4433
[7]   Soluble and processable regioregular poly(3-hexylthiophene) for thin film field-effect transistor applications with high mobility [J].
Bao, Z ;
Dodabalapur, A ;
Lovinger, AJ .
APPLIED PHYSICS LETTERS, 1996, 69 (26) :4108-4110
[8]  
Bartle J., 1997, British Elections Parties Review, V7, P1
[9]   Close look at charge carrier injection in polymer field-effect transistors [J].
Bürgi, L ;
Richards, TJ ;
Friend, RH ;
Sirringhaus, H .
JOURNAL OF APPLIED PHYSICS, 2003, 94 (09) :6129-6137
[10]   Relationship between electroluminescence and current transport in organic heterojunction light-emitting devices [J].
Burrows, PE ;
Shen, Z ;
Bulovic, V ;
McCarty, DM ;
Forrest, SR ;
Cronin, JA ;
Thompson, ME .
JOURNAL OF APPLIED PHYSICS, 1996, 79 (10) :7991-8006