simulation;
finite element analysis;
electric current;
D O I:
10.1108/03321640810836807
中图分类号:
TP39 [计算机的应用];
学科分类号:
081203 [计算机应用技术];
0835 [软件工程];
摘要:
Purpose - Geometric or magnetic anomalies in the wound magnetic core of a residual current circuit breaker can be responsible of its abnonnal tripping. The purpose of this paper is to analyse the core shape contribution to false residual currents (FRCs). Design/methodology/approach - To study precisely the core shape contribution, FEM simulations are investigated. First a 2D multilayer geometry is described thanks to linear regions. Then an apparent anisotropic bulk core is developed and validated in 2D and in 3D. Findings - The air gaps between the magnetic layers develop a shielding effect responsible of the core high sensibility to primary conductors eccentricity. This effect can be easily represented using an anisotropic: bulk core model. Research limitations/implications - The anisotropic material model is basic and has known limitations. Future research should see the development of a new model. Originality/value - FRCs can considerably disturb operation of residual cur-rent device. This paper provides new hypothesis on the origin of theses currents and proposes an anisotropic magnetic material model that simplifies FRC study.
机构:
CNRS, UJF, INPG, Lab Electrotech Grenoble,UMR 5529, F-38400 St Martin Dheres, France
Schneider Elect, F-38320 Eybens, FranceCNRS, UJF, INPG, Lab Electrotech Grenoble,UMR 5529, F-38400 St Martin Dheres, France
Colin, Bruno
;
Chillet, Christian
论文数: 0引用数: 0
h-index: 0
机构:
CNRS, UJF, INPG, Lab Electrotech Grenoble,UMR 5529, F-38400 St Martin Dheres, FranceCNRS, UJF, INPG, Lab Electrotech Grenoble,UMR 5529, F-38400 St Martin Dheres, France
Chillet, Christian
;
Kedous-Lebouc, Afef
论文数: 0引用数: 0
h-index: 0
机构:
CNRS, UJF, INPG, Lab Electrotech Grenoble,UMR 5529, F-38400 St Martin Dheres, FranceCNRS, UJF, INPG, Lab Electrotech Grenoble,UMR 5529, F-38400 St Martin Dheres, France
Kedous-Lebouc, Afef
;
Mas, Patrick
论文数: 0引用数: 0
h-index: 0
机构:
Schneider Elect, F-38320 Eybens, FranceCNRS, UJF, INPG, Lab Electrotech Grenoble,UMR 5529, F-38400 St Martin Dheres, France
机构:
CNRS, UJF, INPG, Lab Electrotech Grenoble,UMR 5529, F-38400 St Martin Dheres, France
Schneider Elect, F-38320 Eybens, FranceCNRS, UJF, INPG, Lab Electrotech Grenoble,UMR 5529, F-38400 St Martin Dheres, France
Colin, Bruno
;
Chillet, Christian
论文数: 0引用数: 0
h-index: 0
机构:
CNRS, UJF, INPG, Lab Electrotech Grenoble,UMR 5529, F-38400 St Martin Dheres, FranceCNRS, UJF, INPG, Lab Electrotech Grenoble,UMR 5529, F-38400 St Martin Dheres, France
Chillet, Christian
;
Kedous-Lebouc, Afef
论文数: 0引用数: 0
h-index: 0
机构:
CNRS, UJF, INPG, Lab Electrotech Grenoble,UMR 5529, F-38400 St Martin Dheres, FranceCNRS, UJF, INPG, Lab Electrotech Grenoble,UMR 5529, F-38400 St Martin Dheres, France
Kedous-Lebouc, Afef
;
Mas, Patrick
论文数: 0引用数: 0
h-index: 0
机构:
Schneider Elect, F-38320 Eybens, FranceCNRS, UJF, INPG, Lab Electrotech Grenoble,UMR 5529, F-38400 St Martin Dheres, France