An electrochemical cell for study by XPS of lithium intercalation in oxide films

被引:4
作者
Castle, JE [1 ]
Guascito, MR
Salvi, AM
Decker, F
机构
[1] Univ Surrey, Guildford GU2 7XH, Surrey, England
[2] Univ Basilicata, I-85100 Potenza, Italy
[3] Univ Roma La Sapienza, I-00185 Rome, Italy
关键词
XPS; electrochemistry; lithium ion batteries; Auger parameter; in situ methods;
D O I
10.1002/sia.1373
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
X-ray photoelectron spectroscopy (XPS) is used to determine valence states of thin films. When used to elucidate the effects of electrochemical intercalation of ions in oxide films, the information required is the valence state of multivalence ions. To ensure that this information is not compromised by surface reoxidation, we have developed an in situ electrochemical cell for use with aprotic and anhydrous electrolytes. This cell has been used to study lithium intercalation in thin oxide layers built up on induim tin oxide (ITO)-coated glass slides. Samples can be exposed for intercalation of lithium (or deintercalation), rinsed, dried and transferred within the vacuum of the spectrometer for characterization. The cell is designed to be withdrawn into a nacelle when not in use so as not to interfere with the normal use of the spectrometer. We have shown that the lithium electrode remains in good condition throughout storage periods. The successful use of the prototype cell gives an opportunity to develop the cell for related electrochemical studies in non-aqueous electrolytes. Copyright (C) 2002 John Wiley Sons, Ltd.
引用
收藏
页码:619 / 622
页数:4
相关论文
共 5 条
[1]   Use of the absolute Auger parameter for vanadium in the study of the dielectric relaxation of cerium vanadate [J].
Castle, JE ;
Salvi, AM ;
Decker, F ;
Moretti, G .
SURFACE AND INTERFACE ANALYSIS, 2002, 33 (06) :533-538
[2]   Use of XPS for the study of cerium-vanadium (electrochromic) mixed oxides [J].
Salvi, AM ;
Decker, F ;
Varsano, F ;
Speranza, G .
SURFACE AND INTERFACE ANALYSIS, 2001, 31 (04) :255-264
[3]   ELECTROCHEMICALLY LITHIATED V2O5 FILMS - AN OPTICALLY PASSIVE ION STORAGE FOR TRANSPARENT ELECTROCHROMIC DEVICES [J].
TALLEDO, A ;
ANDERSSON, AM ;
GRANQVIST, CG .
JOURNAL OF MATERIALS RESEARCH, 1990, 5 (06) :1253-1256
[4]   Lithium diffusion in cerium-vanadium mixed oxide thin films: a systematic study [J].
Varsano, F ;
Decker, F ;
Masetti, E ;
Croce, F .
ELECTROCHIMICA ACTA, 2001, 46 (13-14) :2069-2075
[5]   EMPIRICAL ATOMIC SENSITIVITY FACTORS FOR QUANTITATIVE-ANALYSIS BY ELECTRON-SPECTROSCOPY FOR CHEMICAL-ANALYSIS [J].
WAGNER, CD ;
DAVIS, LE ;
ZELLER, MV ;
TAYLOR, JA ;
RAYMOND, RH ;
GALE, LH .
SURFACE AND INTERFACE ANALYSIS, 1981, 3 (05) :211-225