Na impurity chemistry in photovoltaic CIGS thin films: Investigation with x-ray photoelectron spectroscopy

被引:154
作者
Niles, DW [1 ]
Ramanathan, K [1 ]
Hasoon, F [1 ]
Noufi, R [1 ]
Tielsch, BJ [1 ]
Fulghum, JE [1 ]
机构
[1] KENT STATE UNIV,DEPT CHEM,KENT,OH 44242
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1997年 / 15卷 / 06期
关键词
D O I
10.1116/1.580902
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Thermal processing of Cu(In1-xCax)Se-2 thin-films grown as part of photovoltaic devices on soda-lime glass leads to the incorporation of Na impurity atoms in the Cu(In1-xGax)Se-2. Na contamination increases the photovoltaic efficiency of Cu(In1-xGax)Se-2-based devices. The purpose of this investigation is to develop a model for the chemistry of Na in Cu(In1-xGax)Se-2 in an effort to understand how it improves performance. An analysis of x-ray photoelectron spectroscopy data shows that the Na concentration is similar to 0.1 at. % in the bulk of Cu(In1-xGax)Se-2 thin films and that the Na is bound to Se. The authors propose a model invoking the replacement of column III elements by Na during the growth of Cu(In1-xGax)Se-2 thin films. Na on In and Ga sites would act as acceptor states to enhance photovoltaic device performance. (C) 1997 American Vacuum Society. [S0734-2101(97)00306-0].
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收藏
页码:3044 / 3049
页数:6
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