Near-field second harmonic generation by using uncoated silicon tips

被引：10

作者：

Breit, M.

Malkmus, S.

Feldmann, J.

Danzebrink, H. U.

机构：

[1] Univ Munich, Photon & Optoelect Grp, Dept Phys, D-80799 Munich, Germany

[2] Univ Munich, CeNS, D-80799 Munich, Germany

[3] Phys Tech Bundesanstalt, D-38116 Baunschweig, Germany

来源：

APPLIED PHYSICS LETTERS | 2007年 / 90卷 / 09期

关键词：

D O I：

10.1063/1.2709941

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The authors present a concept of a scanning near-field optical microscope for second harmonic imaging. The microscope is based on uncoated silicon atomic force microscope tips, which provide high intensity transmission in the midinfrared spectral range. An approximately three times larger contrast was found for the second harmonic compared to the linear signal. By using a lithographically designed sample of an array of gold nanoparticles the capability of imaging structures much smaller than the fundamental and second harmonic wavelength is demonstrated. (c) 2007 American Institute of Physics.

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页数：3

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