Imaging organic device function with near-field scanning optical microscopy

被引：33

作者：

McNeill, JD ^{[1
]}

O'Connor, DB ^{[1
]}

Barbara, PF ^{[1
]}

机构：

[1] Univ Texas, Dept Chem & Biochem, Austin, TX 78712 USA

来源：

JOURNAL OF CHEMICAL PHYSICS | 2000年 / 112卷 / 18期

关键词：

D O I：

10.1063/1.481386

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Recent developments in the use of near-field scanning optical microscopy-based techniques to monitor and image physical processes related to device function in thin film organic materials are surveyed. By combining subwavelength optical probes with electro-optical spectroscopic techniques, methods have been developed for measuring the dynamics, spatial variation, and diffusion of energy and charge carriers in organic electro-optical devices. Materials investigated include polymer thin films, polycrystalline and amorphous (glassy) organic films, liquid crystalline materials, and molecular semiconductor heterostructures. (C) 2000 American Institute of Physics. [S0021-9606(00)70416-8].

引用

页码：7811 / 7821

页数：11

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